On-Wafer Dynamic Operation of Power GaN-HEMTs: Degradation Processes Investigated by a Novel Experimental Approach. - Mirco Boito; Manuel Fregolent; Carlo De Santi; A. Abbisogni; S. Smerzi; Isabella Rossetto; Ferdinando Iucolano; Gaudenzio Meneghesso; Enrico Zanoni; Matteo Meneghini (IRPS, 2024)