Automatic partitioning for deterministic test. - Didier Crestani; A. Aguila; M.-H. Gentil; P. Chardon; Christian Durante (EURO-DAC, 1992)

A Hierarchical Test Generation Using High Level Primitives. - Didier Crestani; A. Aguila; L. Eudeline; M.-H. Gentil; Christian Durante (VLSI Design, 1993)