Assessment of the Trench IGBT reliability: low temperature experimental characterization. - Stephane Azzopardi; A. Benmansour; M. Ishiko; Eric Woirgard (Microelectron. Reliab., 2005)

Uni-axial mechanical stress effect on Trench Punch through IGBT under short-circuit operation. - Yassine Belmehdi; Stephane Azzopardi; A. Benmansour; Jean-Yves Delétage; Eric Woirgard (Microelectron. Reliab., 2009)