Anomalous gate oxide conduction on isolation edges: analysis and process optimization. - Andrea Ghetti; D. Brazzelli; A. Benvenuti; G. Ghidini; Alessia Pavan (Microelectron. Reliab., 2003)

Holding voltage investigation of advanced SCR-based protection structures for CMOS technology. - Augusto Tazzoli; Fabio Alessio Marino; Martina Cordoni; A. Benvenuti; Paolo Colombo; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2007)