A test pattern generation unit for memory NPSF built-in self test. - A. Chrisanthopoulos; George Kamoulakos; Y. Tsiatouhas; Angela Arapoyanni (ICECS, 2000)

New memory sense amplifier designs in CMOS technology. - Y. Tsiatouhas; A. Chrisanthopoulos; George Kamoulakos; Th. Haniotakis (ICECS, 2000)

Management of charge pump circuits. - George Kamoulakos; A. Chrisanthopoulos; Y. Tsiatouhas; Angela Arapoyanni (Integr., 2000)

New test pattern generation units for NPSF oriented memory built-in self test. - A. Chrisanthopoulos; Th. Haniotakis; Y. Tsiatouhas; Angela Arapoyanni (ICECS, 2001)

A new flash memory sense amplifier in 0.18 μm CMOS technology. - A. Chrisanthopoulos; Yiannis Moisiadis; A. Varagis; Y. Tsiatouhas; Angela Arapoyanni (ICECS, 2001)

SRAM oriented memory sense amplifier design in 0.18 μm CMOS technology. - A. Chrisanthopoulos; Y. Tsiatouhas; Angela Arapoyanni; Themistoklis Haniotakis (ISCAS (5), 2002)