A. Constant

According to our database1, A. Constant authored at least 4 papers between 2015 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

On csauthors.net:

Bibliography

2023
Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited).
Proceedings of the IEEE International Reliability Physics Symposium, 2023

Drain voltage impact on charge redistribution in GaN-on-Si E-mode MOSc-HEMTs.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Novel High Voltage Bias Temperature Instabilities (HV-BTI) setup to monitor RON/VTH drift on GaN-on-Si E-mode MOSc-HEMTs under drain voltage.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2015
Technology and design of GaN power devices.
Proceedings of the 45th European Solid State Device Research Conference, 2015


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