The use of a noise stimulus in ADC characterization. - Raul Carneiro Martins; António Manuel da Cruz Serra (ICECS, 1998)

Automated ADC characterization using the histogram test stimulated by Gaussian noise. - Raul Carneiro Martins; António Manuel da Cruz Serra (IEEE Trans. Instrum. Meas., 1999)

Automatic calibration of analog and digital measuring instruments using computer vision. - Francisco André Corrêa Alegria; António Manuel da Cruz Serra (IEEE Trans. Instrum. Meas., 2000)

ADC interbit modulation: description, detection and quantification. - Raul Carneiro Martins; António Manuel da Cruz Serra (Comput. Stand. Interfaces, 2001)

Influence of frequency errors in the variance of the cumulative histogram [in ADC testing]. - Francisco André Corrêa Alegria; António Manuel da Cruz Serra (IEEE Trans. Instrum. Meas., 2001)

A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing. - Pasquale Arpaia; António Manuel da Cruz Serra; Conceigio Libano Monteiro (IEEE Trans. Instrum. Meas., 2001)

Performance analysis of an ADC histogram test using small triangular waves. - Francisco André Corrêa Alegria; Pasquale Arpaia; António Manuel da Cruz Serra; Pasquale Daponte (IEEE Trans. Instrum. Meas., 2002)

Introduction to the special issue on ADC testing, 6th EuroWorkshop on ADC Modelling and Testing. - A. Cruz Serra (Comput. Stand. Interfaces, 2003)

New methods to improve convergence of sine fitting algorithms. - Manuel Fonseca da Silva; A. Cruz Serra (Comput. Stand. Interfaces, 2003)

Variance of the cumulative histogram of ADCs due to frequency errors. - Francisco André Corrêa Alegria; António Manuel da Cruz Serra (IEEE Trans. Instrum. Meas., 2003)

Representation and measurement of nonlinearities in stimulus signals. - Raul Carneiro Martins; António Manuel da Cruz Serra (IEEE Trans. Instrum. Meas., 2003)

Analog-to-digital converter testing - new proposals. - A. Cruz Serra; F. Corrêa Alegria; Raul Carneiro Martins; Manuel Fonseca da Silva (Comput. Stand. Interfaces, 2004)

Performance of data acquisition systems from the user's point of view. - Francisco André Corrêa Alegria; Pedro Silva Girão; Vladimír Haasz; A. Cruz Serra (IEEE Trans. Instrum. Meas., 2004)

An FFT-based method to evaluate and compensate gain and offset errors of interleaved ADC systems. - José Miguel Dias Pereira; P. M. B. Silva Girao; António Manuel da Cruz Serra (IEEE Trans. Instrum. Meas., 2004)

Effective ADC linearity testing using sinewaves. - Francisco André Corrêa Alegria; Antonio Moschitta; Paolo Carbone; António Manuel da Cruz Serra; Dario Petri (IEEE Trans. Circuits Syst. I Regul. Pap., 2005)

Uncertainty of ADC random noise estimates obtained with the IEEE 1057 standard test. - Francisco André Corrêa Alegria; António Manuel da Cruz Serra (IEEE Trans. Instrum. Meas., 2005)

Overdrive in the ramp histogram test of ADCs. - Francisco André Corrêa Alegria; António Manuel da Cruz Serra (IEEE Trans. Instrum. Meas., 2005)

Combined spectral and histogram analysis for fast ADC testing. - António Manuel da Cruz Serra; Manuel Fonseca da Silva; Pedro M. Ramos; Raul Carneiro Martins; Linus Michaeli; Ján Saliga (IEEE Trans. Instrum. Meas., 2005)

ADC transfer curve types - A review. - F. Corrêa Alegria; A. Cruz Serra (Comput. Stand. Interfaces, 2006)

Simulation and experimental results of multiharmonic least-squares fitting algorithms applied to periodic signals. - Pedro M. Ramos; Manuel Fonseca da Silva; Raul Carneiro Martins; António Manuel da Cruz Serra (IEEE Trans. Instrum. Meas., 2006)

Standard Histogram Test Precision of ADC Gain and Offset Error Estimation. - F. Corrêa Alegria; A. Cruz Serra (IEEE Trans. Instrum. Meas., 2007)

Least Squares Multiharmonic Fitting: Convergence Improvements. - Pedro M. Ramos; A. Cruz Serra (IEEE Trans. Instrum. Meas., 2007)

Impedance measurement using multiharmonic least-squares waveform fitting algorithm. - Pedro M. Ramos; A. Cruz Serra (Comput. Stand. Interfaces, 2008)

PQ Monitoring System for Real-Time Detection and Classification of Disturbances in a Single-Phase Power System. - Tomás Radil; Pedro M. Ramos; Fernando M. Janeiro; A. Cruz Serra (IEEE Trans. Instrum. Meas., 2008)

Impedance Measurement With Sine-Fitting Algorithms Implemented in a DSP Portable Device. - Tomás Radil; Pedro M. Ramos; A. Cruz Serra (IEEE Trans. Instrum. Meas., 2008)

Precision of Independently Based Gain and Offset Error of an ADC Using the Histogram Method. - F. Corrêa Alegria; A. Cruz Serra (IEEE Trans. Instrum. Meas., 2009)

The Histogram Test of ADCs With Sinusoidal Stimulus Is Unbiased by Phase Noise. - F. Corrêa Alegria; A. Cruz Serra (IEEE Trans. Instrum. Meas., 2009)

New Spectrum Leakage Correction Algorithm for Frequency Estimation of Power System Signals. - Tomás Radil; Pedro M. Ramos; A. Cruz Serra (IEEE Trans. Instrum. Meas., 2009)

Recent Developments on Impedance Measurements With DSP-Based Ellipse-Fitting Algorithms. - Pedro M. Ramos; Fernando M. Janeiro; Mouhaydine Tlemçani; A. Cruz Serra (IEEE Trans. Instrum. Meas., 2009)

IEEE 1057 Jitter Test of Waveform Recorders. - Shahram Shariat-Panahi; Francisco André Corrêa Alegria; Antoni Mánuel Lázaro; António Manuel da Cruz Serra (IEEE Trans. Instrum. Meas., 2009)

Gaussian Jitter-Induced Bias of Sine Wave Amplitude Estimation Using Three-Parameter Sine Fitting. - F. Corrêa Alegria; A. Cruz Serra (IEEE Trans. Instrum. Meas., 2010)

Cross-Correlation and Sine-Fitting Techniques for High-Resolution Ultrasonic Ranging. - Ricardo Queirós; Francisco André Corrêa Alegria; Pedro Silva Girão; António Manuel da Cruz Serra (IEEE Trans. Instrum. Meas., 2010)

An Alternating Direction Algorithm for Total Variation Reconstruction of Distributed Parameters. - Nuno B. Bras; José M. Bioucas-Dias; Raul Carneiro Martins; A. Cruz Serra (IEEE Trans. Image Process., 2012)