High temperature reliability testing of aluminum and tantalum electrolytic capacitors. - A. Dehbi; Wolfgang Wondrak; Yves Ousten; Yves Danto (Microelectron. Reliab., 2002)

Vibration lifetime modelling of PCB assemblies using steinberg model. - A. Dehbi; Yves Ousten; Yves Danto; Wolfgang Wondrak (Microelectron. Reliab., 2005)

Failure mechanisms and qualification testing of passive components. - H. A. Post; P. Letullier; T. Briolat; R. Humke; R. Schuhmann; K. Saarinen; W. Werner; Yves Ousten; G. Lekens; A. Dehbi (Microelectron. Reliab., 2005)

Defect detection in multilayer ceramic capacitors. - V. Krieger; Wolfgang Wondrak; A. Dehbi; W. Bartel; Yves Ousten; Bruno Levrier (Microelectron. Reliab., 2006)