Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. - S. Huyghe; Laurent Béchou; Nicolas Zerounian; Yannick Deshayes; Frédéric Aniel; A. Denolle; Dominique Laffitte; Jean-Luc Goudard; Yves Danto (Microelectron. Reliab., 2005)