Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS-BICMOS technologies. - Philippe Galy; Sylvain Dudit; Michel Vallet; Ph. Larre; M. Bilinski; E. Petit; J. Beltritti; A. Dray; Jean Jimenez; Frank Jezequel; R. Chevallier; C. Boutonnat; et al. (Microelectron. Reliab., 2010)

A full characterization of single pitch IO ESD protection based on silicon controlled rectifier and dynamic trigger circuit in CMOS 32 nm node. - J. Bourgeat; Philippe Galy; A. Dray; Jean Jimenez; D. Marin-Cudraz; Blaise Jacquier (Microelectron. Reliab., 2011)

BIMOS transistor and its applications in ESD protection in advanced CMOS technology. - Philippe Galy; Jean Jimenez; Johan Bourgeat; A. Dray; Ghislain Troussier; Boris Heitz; Nicolas Guitard; David Marin-Cudraz; H. Beckrich-Ros (ICICDT, 2012)