Modeling and simulation of resistivity of nanometer scale copper. - A. Emre Yarimbiyik; Harry A. Schafft; Richard A. Allen; Mona E. Zaghloul; David L. Blackburn (Microelectron. Reliab., 2006)

Experimental and simulation studies of resistivity in nanoscale copper films. - A. Emre Yarimbiyik; Harry A. Schafft; Richard A. Allen; Mark D. Vaudin; Mona E. Zaghloul (Microelectron. Reliab., 2009)