A. Ghetti

According to our database, A. Ghetti authored at least 8 papers between 2001 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Non-poissonian behavior of hot carrier degradation induced variability in MOSFETs.

Roberta Bottini, Andrea Ghetti, Sara Vigano, Maria Grazia Valentini, Pratap Murali, Chandra Mouli

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2014

Set/reset statistics and kinetics in phase change memory arrays.

Maurizio Rizzi, Nicola Ciocchini, Daniele Ielmini, Andrea Ghetti, Paolo Fantini

Proceedings of the 44th European Solid State Device Research Conference, 2014

2007

High voltage transistor degradation in NVM pump application.

Roberta Bottini, Sonia Costantini, Nadia Galbiati, Andrea Ghetti, Gabriella Ghidini, Aurelio Giancarlo Mauri, Claudia Scozzari, Alessandro Sebastiani

Microelectron. Reliab., 2007

2005

Impact of interface and bulk trapped charges on transistor reliability.

G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, Andrea Ghetti, N. Galbiati, G. Giusto, A. Garavaglia

Microelectron. Reliab., 2005

2003

Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET.

G. Ghidini, A. Garavaglia, G. Giusto, Andrea Ghetti, R. Bottini, D. Peschiaroli, M. Scaravaggi, F. Cazzaniga, Daniele Ielmini

Microelectron. Reliab., 2003

Anomalous gate oxide conduction on isolation edges: analysis and process optimization.

Andrea Ghetti, D. Brazzelli, A. Benvenuti, G. Ghidini, Alessia Pavan

Microelectron. Reliab., 2003

2002

Post-breakdown characterization in thin gate oxides.

E. Viganò, A. Ghetti, Gabriella Ghidini, Alessandro S. Spinelli

Microelectron. Reliab., 2002

2001

Anode hole generation mechanisms.

A. Ghetti, M. Alam, J. Bude

Microelectron. Reliab., 2001