Anode hole generation mechanisms. - A. Ghetti; M. Alam; J. Bude (Microelectron. Reliab., 2001)

Post-breakdown characterization in thin gate oxides. - E. Viganò; A. Ghetti; Gabriella Ghidini; Alessandro S. Spinelli (Microelectron. Reliab., 2002)

Anomalous gate oxide conduction on isolation edges: analysis and process optimization. - Andrea Ghetti; D. Brazzelli; A. Benvenuti; G. Ghidini; Alessia Pavan (Microelectron. Reliab., 2003)

Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET. - G. Ghidini; A. Garavaglia; G. Giusto; Andrea Ghetti; R. Bottini; D. Peschiaroli; M. Scaravaggi; F. Cazzaniga; Daniele Ielmini (Microelectron. Reliab., 2003)

Impact of interface and bulk trapped charges on transistor reliability. - G. Ghidini; M. Langenbuch; R. Bottini; D. Brazzelli; Andrea Ghetti; N. Galbiati; G. Giusto; A. Garavaglia (Microelectron. Reliab., 2005)

High voltage transistor degradation in NVM pump application. - Roberta Bottini; Sonia Costantini; Nadia Galbiati; Andrea Ghetti; Gabriella Ghidini; Aurelio Giancarlo Mauri; Claudia Scozzari; Alessandro Sebastiani (Microelectron. Reliab., 2007)

Set/reset statistics and kinetics in phase change memory arrays. - Maurizio Rizzi; Nicola Ciocchini; Daniele Ielmini; Andrea Ghetti; Paolo Fantini (ESSDERC, 2014)

Non-poissonian behavior of hot carrier degradation induced variability in MOSFETs. - Roberta Bottini; Andrea Ghetti; Sara Vigano; Maria Grazia Valentini; Pratap Murali; Chandra Mouli (IRPS, 2018)