Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices. - Michael Heer; Sergey Bychikhin; W. Mamanee; Dionyz Pogany; A. Heid; P. Grombach; M. Klaussner; Winfried Soppa; Bernd Ramler (Microelectron. Reliab., 2007)

Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications. - Michael Heer; P. Grombach; A. Heid; Dionyz Pogany (Microelectron. Reliab., 2008)