Impact of back side circuit edit on active device performance in bulk silicon ICs. - Uwe Kerst; Rudolf Schlangen; A. Kabakow; Erwan Le Roy; Ted R. Lundquist; Siegfried Pauthner (ITC, 2005)

Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. - Rudolf Schlangen; Uwe Kerst; A. Kabakow; Christian Boit (Microelectron. Reliab., 2005)