Long-term reliability of Ti-Pt-Au metallization system for Schottky contact and first-level metallization on SiC MESFET. - A. Sozza; Christian Dua; A. Kerlain; C. Brylinski; Enrico Zanoni (Microelectron. Reliab., 2004)

Robust, versatile, direct low-frequency noise characterization method for material/process quality control using cross-shaped 4-terminal devices. - A. Kerlain; V. Mosser (Microelectron. Reliab., 2005)