Contact resistivity instability in embedded SRAM memory. - A. Mervic; A. Lanzani; M. Menchise; P. Serra; D. Gerosa (Microelectron. Reliab., 2002)

Read disturb in flash memories: reliability case. - P. Tanduo; Luca Cola; S. Testa; M. Menchise; A. Mervic (Microelectron. Reliab., 2006)

Read disturb on flash memories: Study on temperature annealing effect. - Luca Cola; M. De Tomasi; Riccardo Enrici Vaion; A. Mervic; P. Zabberoni (Microelectron. Reliab., 2012)

Metal fatigue in copper pillar Flip Chip BGA: A refined acceleration model for the aluminium pad cracking failure mechanism. - R. Alberti; Riccardo Enrici Vaion; A. Mervic; S. Testa (Microelectron. Reliab., 2015)