Debriefing surgeons on non-technical skills (NOTSS). - Steven J. Yule; Rhona Flin; N. Maran; G. Youngson; A. Mitchell; D. Rowley; S. Paterson-Brown (Cogn. Technol. Work., 2008)

Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process. - Andreas Martin 002; Rolf-Peter Vollertsen; A. Mitchell; M. Traving; D. Beckmeier; H. Nielen (Microelectron. Reliab., 2016)