Intrinsic sensitivity of Cd1-xZnxTe semiconductors for digital radiographic imaging. - George C. Giakos; R. Guntupalli; J. Alexis De Abreu Garcia; N. Shah; Srinivasan Vedantham; Sankararaman Suryanarayanan; Samir Chowdhury 002; N. Patnekar; S. Sumrain; K. Mehta; Edward A. Evans; A. Orozco; et al. (IEEE Trans. Instrum. Meas., 2003)

Detective quantum efficiency [DQE(0)] of CZT semiconductor detectors for digital radiography. - George C. Giakos; Sankararaman Suryanarayanan; R. Guntupalli; J. Odogba; N. Shah; Srinivasan Vedantham; Samir Chowdhury 002; K. Mehta; S. Sumrain; N. Patnekar; A. Moholkar; V. Kumar; et al. (IEEE Trans. Instrum. Meas., 2004)