An Extrapolation Model for Lifetime Prediction for Off-State - Degradation of MOS-FETs. - A. Muehlhoff (Microelectron. Reliab., 2001)

Inversion of degradation direction of n-channel MOS-FETs in off-state operation. - A. Muehlhoff (Microelectron. Reliab., 2002)

A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology. - Wafa Arfaoui; Germain Bossu; A. Muehlhoff; D. Lipp; R. Manuwald; T. Chen; Tanya Nigam; Mahesh Siddabathula (IRPS, 2020)