Reliability Testing by Precise Electrical Measurement. - A. P. Dorey; B. K. Jones; Andrew Mark David Richardson; P. C. Russell; Y. Z. Xu (ITC, 1988)

On the development of power supply voltage control testing technique for analogue circuits. - Abu Khari bin A'Ain; A. H. Bratt; A. P. Dorey (Asian Test Symposium, 1995)

A design-for-test structure for optimising analogue and mixed signal IC test. - A. H. Bratt; Andrew Mark David Richardson; R. J. A. Harvey; A. P. Dorey (ED&TC, 1995)

Exposing floating gate defects in analogue CMOS circuits by power supply voltage control testing technique. - Abu Khari bin A'Ain; A. H. Bratt; A. P. Dorey (VLSI Design, 1995)

Design and testing of a PI controller ASIC. - Ian Andrew Grout; S. E. Burge; A. P. Dorey (Microprocess. Microsystems, 1995)

Testing Analogue Circuits by A C Power Supply Voltage. - Abu Khari bin A'Ain; A. H. Bratt; A. P. Dorey (VLSI Design, 1996)

A conceptual study for a computer-based tool to support electronics design in a mechatronic environment. - R. M. Walters; David A. Bradley; A. P. Dorey (Microprocess. Microsystems, 2000)