AC TDDB extensive study for an enlargement of its impact and benefit on circuit lifetime assessment. - M. Rafik; A. P. Nguyen; Xavier Garros; M. Arabi; X. Federspiel; Cheikh Diouf (IRPS, 2018)

Impact of Passive & Active Load Gate Impedance on Breakdown Hardness in 28nm FDSOI Technology. - A. P. Nguyen; Xavier Garros; M. Rafik; Florian Cacho; David Roy 001; Xavier Federspiel; Fred Gaillard (IRPS, 2019)