Partial set for flip-flops based on state requirement for non-scan BIST scheme. - Marie-Lise Flottes; Christian Landrault; A. Petitqueux (ETW, 1999)

Design for sequential testability: an internal state reseeding approach for 100 % fault coverage. - Marie-Lise Flottes; Christian Landrault; A. Petitqueux (Asian Test Symposium, 2000)

A Unified DFT Approach for BIST and External Test. - Marie-Lise Flottes; Christian Landrault; A. Petitqueux (J. Electron. Test., 2003)