Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. - Georg Haberfehlner; Sergey Bychikhin; Viktor Dubec; Michael Heer; A. Podgaynaya; M. Pfost; Matthias Stecher; Erich Gornik; Dionyz Pogany (Microelectron. Reliab., 2009)

Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization. - A. Podgaynaya; Ralf Rudolf; B. Elattari; Dionyz Pogany; Erich Gornik; Matthias Stecher; Marc Strasser (Microelectron. Reliab., 2010)