Finite-Element Simulation of Local Oxidation of Silicon. - A. Poncet (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1985)

Lifetime monitoring for risk minimization. - A. Poncet; Andrew D. B. Paice; K. Mossig (ECC, 1999)

Parameters extraction of hafnium based gate oxide capacitors. - T. Nguyen; C. Busseret; Liviu Militaru; A. Poncet; D. Aimé; Nicolas Baboux; Carole Plossu (Microelectron. Reliab., 2007)

Challenges and prospects of RF oscillators using silicon resonant tunneling diodes. - Emanuela Buccafurri; Abdelkrim Medjahdi; Françis Calmon; Raphael Clerc; Marco Pala 001; A. Poncet; Gérard Ghibaudo (ESSCIRC, 2009)