A burn-in tolerant dynamic circuit technique. - Atila Alvandpour; Ram Krishnamurthy 001; Shekhar Borkar; A. Rahman; Clair Webb (CICC, 2002)

Technology scaling implications for BTI reliability. - Stephen M. Ramey; Chetan Prasad; A. Rahman (Microelectron. Reliab., 2018)

The Use of Virtual Reality Platforms to Improve Students' Speaking Skills. - A. Rahman; Umar Umar; Zainudin Hassan; Rauzan Sumara (IPMV, 2024)