Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism. - Jacopo Iannacci; A. Repchankova; Alessandro Faes; Augusto Tazzoli; Gaudenzio Meneghesso; Gian-Franco Dalla Betta (Microelectron. Reliab., 2010)

An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches. - Jacopo Iannacci; Alessandro Faes; A. Repchankova; Augusto Tazzoli; Gaudenzio Meneghesso (Microelectron. Reliab., 2011)