Modeling of dynamic trap density increase for aging simulation of any MOSFET circuits. - Mitiko Miura-Mattausch; Hidenori Miyamoto; Hideyuki Kikuchihara; Dondee Navarro; Tapas K. Maiti; Nezam Rohbani; C. Ma; Hans Jürgen Mattausch; A. Schiffmann; Alexander Steinmair; Ehrenfried Seebacher (ESSDERC, 2017)