Long-term reliability of Ti-Pt-Au metallization system for Schottky contact and first-level metallization on SiC MESFET. - A. Sozza; Christian Dua; A. Kerlain; C. Brylinski; Enrico Zanoni (Microelectron. Reliab., 2004)

Reliability Investigation of Gallium Nitride HEMT. - A. Sozza; Christian Dua; Erwan Morvan; Bertrand Grimbert; V. Hoel; Sylvain L. Delage; N. Chaturvedi; Richard Lossy; Joachim Würfl (Microelectron. Reliab., 2004)

A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications. - A. Sozza; Christian Dua; Erwan Morvan; Bertrand Grimbert; Sylvain L. Delage (Microelectron. Reliab., 2005)

AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements. - A. Sozza; Arnaud Curutchet; Christian Dua; Nathalie Malbert; Nathalie Labat; André Touboul (Microelectron. Reliab., 2006)