Investigating Reliability Aspects of Memristor based RRAM with Reference to Write Voltage and Frequency. - Tukaram D. Dongale; K. V. Khot; S. V. Mohite; N. K. Desai; Sumedha S. Shinde; A. V. Moholkar; K. Y. Rajpure; P. N. Bhosale; P. S. Patil; P. K. Gaikwad; Rajanish K. Kamat (CoRR, 2016)