ESD-Induced Circuit Performance Degradation in RFICs. - K. Gonf; H. G. Feng; R. Y. Zhan; A. Z. Wang (Microelectron. Reliab., 2001)

RC-SCR: a novel low-voltage ESD protection circuit with new triggering mechanism. - H. Feng; R. Zhan; Q. Wu; G. Chen; X. Guan; A. Z. Wang (APCCAS (2), 2002)

A new algorithm for ESD protection device extraction based on subgraph isomorphism. - R. Zhan; H. Feng; Q. Wu; G. Chen; X. Guan; A. Z. Wang (APCCAS (2), 2002)