A Review on Key Issues and Challenges in Devices Level MEMS Testing. - Muhammad Shoaib 002; Nor Hisham Hamid; Aamir Farooq Malik; Noohul Basheer Zain Ali; Mohammad Tariq Jan (J. Sensors, 2016)

FEM Analysis of Sezawa Mode SAW Sensor for VOC Based on CMOS Compatible AlN/SiO2/Si Multilayer Structure. - Muhammad Zubair Aslam; Varun Jeoti; Saravanan Karuppanan; Aamir Farooq Malik; Asif Iqbal 010 (Sensors, 2018)