Machine Learning for Analyzing Atomic Force Microscopy (AFM) Images Generated from Polymer Blends. - Aanish Paruchuri; Yunfei Wang; Xiaodan Gu; Arthi Jayaraman (CoRR, 2024)

Machine Learning for Identifying Grain Boundaries in Scanning Electron Microscopy (SEM) Images of Nanoparticle Superlattices. - Aanish Paruchuri; Carl Thrasher; A. J. Hart; Robert MacFarlane; Arthi Jayaraman (CoRR, 2025)