Electro-thermal characterization and simulation of integrated multi-trenched XtreMOSTM power devices. - J. Rhayem; B. Besbes; Raul Blecic; Sergey Bychikhin; Georg Haberfehlner; Dionyz Pogany; B. Desoete; Renaud Gillon; Aarnout Wieers; Marnix Tack (Microelectron. J., 2012)

Model Order Reduction for nanoelectronics coupled problems with many inputs. - Nicodemus Banagaaya; Lihong Feng; Wim Schoenmaker; Peter Meuris; Aarnout Wieers; Renaud Gillon; Peter Benner (DATE, 2016)

Shape optimization of a power MOS device under uncertainties. - Piotr Putek; Peter Meuris; Roland Pulch; E. Jan W. ter Maten; Michael Gunther; Wim Schoenmaker; Frederik Deleu; Aarnout Wieers (DATE, 2016)