Fast and accurate linearity test for DACs with various architectures using segmented models. - Shravan K. Chaganti; Abalhassan Sheikh; Sumit Dubey; Frank Ankapong; Nitin Agarwal; Degang Chen 001 (ITC, 2018)

Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing. - Praise O. Farayola; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (VTS, 2020)

Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (DTIS, 2021)

An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study. - Isaac Bruce; Praise O. Farayola; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ETS, 2021)

Systematic Hardware Error Identification and Calibration for Massive Multisite Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ITC, 2021)

Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing. - Praise O. Farayola; Shravan K. Chaganti; Abdullah O. Obaidi; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2021)

Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (DFT, 2022)

Graph Theory Approach for Multi-site ATE Board Parameter Extraction. - Abraham Steenhoek; Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ETS, 2022)

Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (ITC, 2022)

The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (VTS, 2022)

A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. - Praise O. Farayola; Isaac Bruce; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (J. Electron. Test., 2022)

A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing. - Isaac Bruce; Praise O. Farayola; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (J. Electron. Test., 2023)

Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction. - Praise O. Farayola; Ekaniyere Oko-Odion; Shravan K. Chaganti; Abalhassan Sheikh; Srivaths Ravi 001; Degang Chen 001 (IEEE Des. Test, 2023)