On-wafer probe station for microwave metrology at the nanoscale. - Abdelhatif El Fellahi; Kamel Haddadi; Jaouad Marzouk; Steve Arscott; Christophe Boyaval; Tuami Lasri; Gilles Dambrine (I2MTC, 2015)

Measurement accuracy and repeatability in near-field scanning microwave microscopy. - Sijia Gu; Kamel Haddadi; Abdelhatif El Fellahi; Gilles Dambrine; Tuami Lasri (I2MTC, 2015)

Setting Parameters Influence on Accuracy and Stability of Near-Field Scanning Microwave Microscopy Platform. - Sijia Gu; Kamel Haddadi; Abdelhatif El Fellahi; Tuami Lasri (IEEE Trans. Instrum. Meas., 2016)