From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. - Felix Beaudoin; Romain Desplats; Philippe Perdu; Abdellatif Firiti; Gérald Haller; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2003)

Short defect characterization based on TCR parameter extraction. - Abdellatif Firiti; D. Faujour; Gérald Haller; J. M. Moragues; Vincent Goubier; Philippe Perdu; Felix Beaudoin; Dean Lewis (Microelectron. Reliab., 2003)

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. - Olivier Crépel; Patrick Poirier; Philippe Descamps; Romain Desplats; Philippe Perdu; Gérald Haller; Abdellatif Firiti (Microelectron. Reliab., 2004)

Understanding the effects of NIR laser stimulation on NMOS transistor. - Abdellatif Firiti; Felix Beaudoin; Gérald Haller; Philippe Perdu; Dean Lewis; Pascal Fouillat (Microelectron. Reliab., 2004)

Impact of semiconductors material on IR Laser Stimulation signal. - Abdellatif Firiti; Felix Beaudoin; Gérald Haller; Philippe Perdu; Dean Lewis; Pascal Fouillat (Microelectron. Reliab., 2005)

A new method to quantify retention-failed cells of an EEPROM CAST. - Claire Le Roux; Laurent Lopez; Abdellatif Firiti; Jean-Luc Ogier; Frédéric Lalande; Romain Laffont; Gilles Micolau (Microelectron. Reliab., 2007)

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. - Magdalena Sienkiewicz; Philippe Perdu; Abdellatif Firiti; Kevin Sanchez; Olivier Crépel; Dean Lewis (Microelectron. Reliab., 2008)