Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions. - Maximilian Lederer; Franz Müller 001; Raik Hoffmann; Ricardo Olivo; Yannick Raffel; Shouzhuo Yang; Sourav De 002; Roman Potjan; Oliver Ostien; Abdelrahman Altawil; Ayse Sünbül; David Lehninger; et al. (IMW, 2024)