Estimation of Simultaneous Switching Power and Ground Noise of Static CMOS Combinational Circuits. - Abdessatar Abderrahman; Bozena Kaminska; Yvon Savaria (EDAC-ETC-EUROASIC, 1994)

Optimization-based multifrequency test generation for analog circuits. - Abdessatar Abderrahman; Bozena Kaminska; Eduard Cerny (J. Electron. Test., 1996)

CLP-based Multifrequency Test Generation for Analog Circuits. - Abdessatar Abderrahman; Eduard Cerny; Bozena Kaminska (VTS, 1997)

Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuits. - Abdessatar Abderrahman; Eduard Cerny; Bozena Kaminska (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)

New Analog Test Metrics Based on Probabilistic and Deterministic Combination Approaches. - Abdessatar Abderrahman; Mohamad Sawan; Yvon Savaria; Abdelhakim Khouas (ICECS, 2007)