Embedded Test for Highly Accurate Defect Localization. - Abdullah Mumtaz; Michael E. Imhof; Stefan Holst; Hans-Joachim Wunderlich (Asian Test Symposium, 2011)

P-PET: Partial pseudo-exhaustive test for high defect coverage. - Abdullah Mumtaz; Michael E. Imhof; Hans-Joachim Wunderlich (ITC, 2011)

Variation-Aware Fault Grading. - Alexander Czutro; Michael E. Imhof; J. Jiang; Abdullah Mumtaz; Matthias Sauer 002; Bernd Becker 001; Ilia Polian; Hans-Joachim Wunderlich (Asian Test Symposium, 2012)

Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test. - Alejandro Cook; Sybille Hellebrand; Michael E. Imhof; Abdullah Mumtaz; Hans-Joachim Wunderlich (LATW, 2012)

Variation-aware deterministic ATPG. - Matthias Sauer 002; Ilia Polian; Michael E. Imhof; Abdullah Mumtaz; Eric Schneider; Alexander Czutro; Hans-Joachim Wunderlich; Bernd Becker 001 (ETS, 2014)