Employing transistor reliability testing as an FA tool for understanding HTOL product BIST failures. - Abdullah Yassine; Lauren Blair; Wayland Seifert (IRPS, 2015)

Global Control Signal Defect Diagnosis in Volume Production Environment. - Szczepan Urban; Piotr Zimnowlodzki; Manish Sharma; Shraddha Bodhe; John Schulze; Abdullah Yassine; Adam Styblinski (ITC, 2023)