Reliability analysis for electronic devices using beta-Weibull distribution. - Luis Carlos Méndez-González; Luis Alberto Rodríguez-Picón; Delia J. Valles-Rosales; Roberto Romero-López; Abel Eduardo Quezada-Carreón (Qual. Reliab. Eng. Int., 2017)

Reliability analysis using exponentiated Weibull distribution and inverse power law. - Luis Carlos Méndez-González; Luis Alberto Rodríguez-Picón; Delia J. Valles-Rosales; Alejandro Alvarado-Iniesta; Abel Eduardo Quezada-Carreón (Qual. Reliab. Eng. Int., 2019)

A reliability analysis for electronic devices under an extension of exponentiated perks distribution. - Luis Carlos Méndez-González; Luis Alberto Rodríguez-Picón; Iván Juan Carlos Pérez-Olguín; Vicente García 001; Abel Eduardo Quezada-Carreón (Qual. Reliab. Eng. Int., 2023)