Development of a MEMS Testing Methodology. - Abhijeet Kolpekwar; Ronald D. Blanton (ITC, 1997)

Failure modes for stiction in surface-micromachined MEMS. - Abhijeet Kolpekwar; Ronald D. Blanton; David Woodilla (ITC, 1998)

MEMS fault model generation using CARAMEL. - Abhijeet Kolpekwar; Chris S. Kellen; Ronald D. Blanton (ITC, 1998)