Abhishek Singh

Affiliations:
  • University of Maryland, Baltimore County, MD, USA


According to our database1, Abhishek Singh authored at least 11 papers between 2001 and 2006.

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Bibliography

2006
Defect Simulation Methodology for i<sub>DDT</sub> Testing.
J. Electron. Test., 2006

Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method.
IEEE Des. Test Comput., 2006

2005
Defect Detection Using Quiescent Signal Analysis.
J. Electron. Test., 2005

2004
Fault Simulation Model for i{DDT} Testing: An Investigation.
Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

On-Chip Impulse Response Generation for Analog and Mixed-Signal Testing.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Defect detection under Realistic Leakage Models using Multiple IDDQ Measurement.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003
Power supply transient signal analysis for defect-oriented test.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003

Path Delay Estimation using Power Supply Transient Signals: A Comparative Study using Fourier and Wavelet Analysis.
Proceedings of the 2003 International Conference on Computer-Aided Design, 2003

Comparison of Branching CORDIC Implementations.
Proceedings of the 14th IEEE International Conference on Application-Specific Systems, 2003

2002
Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models.
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

2001
Detecting delay faults using power supply transient signal analysis.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001


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