Detecting delay faults using power supply transient signal analysis. - Abhishek Singh 001; Chintan Patel; Shirong Liao; James F. Plusquellic; Anne E. Gattiker (ITC, 2001)

Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models. - Abhishek Singh 001; Jim Plusquellic; Anne E. Gattiker (VTS, 2002)

Comparison of Branching CORDIC Implementations. - Abhishek Singh 001; Dhananjay S. Phatak; Tom Goff; Mike Riggs; James F. Plusquellic; Chintan Patel (ASAP, 2003)

Path Delay Estimation using Power Supply Transient Signals: A Comparative Study using Fourier and Wavelet Analysis. - Abhishek Singh 001; Jitin Tharian; Jim Plusquellic (ICCAD, 2003)

Power supply transient signal analysis for defect-oriented test. - James F. Plusquellic; Abhishek Singh 001; Chintan Patel; Anne E. Gattiker (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003)

Defect detection under Realistic Leakage Models using Multiple IDDQ Measurement. - Chintan Patel; Abhishek Singh 001; Jim Plusquellic (ITC, 2004)

On-Chip Impulse Response Generation for Analog and Mixed-Signal Testing. - Abhishek Singh 001; Chintan Patel; Jim Plusquellic (ITC, 2004)

Fault Simulation Model for i{DDT} Testing: An Investigation. - Abhishek Singh 001; Chintan Patel; Jim Plusquellic (VTS, 2004)

Defect Detection Using Quiescent Signal Analysis. - Chintan Patel; Abhishek Singh 001; Jim Plusquellic (J. Electron. Test., 2005)

Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method. - Jim Plusquellic; Dhruva Acharyya; Abhishek Singh 001; Mohammad Tehranipoor; Chintan Patel (IEEE Des. Test Comput., 2006)

Defect Simulation Methodology for iDDT Testing. - Abhishek Singh 001; Jim Plusquellic; Dhananjay S. Phatak; Chintan Patel (J. Electron. Test., 2006)