Testing and Diagnosis of Interconnects Using Boundary Scan Architecture. - Abu S. M. Hassan; Vinod K. Agarwal; Janusz Rajski (ITC, 1988)

Testing of Glue Logic Interconnects Using Boundary Scan Architecture. - Abu S. M. Hassan; Vinod K. Agarwal; Janusz Rajski; Benoit Nadeau-Dostie (ITC, 1989)

ScanBIST: A Multi-frequency Scan-based BIST Method. - Benoit Nadeau-Dostie; Dwayne Burek; Abu S. M. Hassan (ITC, 1992)

BIST of PCB interconnects using boundary-scan architecture. - Abu S. M. Hassan; Vinod K. Agarwal; Benoit Nadeau-Dostie; Janusz Rajski (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)

ScanBist: A Multifrequency Scan-Based BIST Method. - Benoit Nadeau-Dostie; Dwayne Burek; Abu S. M. Hassan (IEEE Des. Test Comput., 1994)

Logic BIST for large industrial designs: real issues and case studies. - Graham Hetherington; Tony Fryars; Nagesh Tamarapalli; Mark Kassab; Abu S. M. Hassan; Janusz Rajski (ITC, 1999)