Analysis and calibration of process variations for an array of temperature sensors. - Shuang Xie; Accel Abarca; Jules Markenhof; Xiaoliang Ge; Albert Theuwissen (IEEE SENSORS, 2017)

A CMOS Image Sensor Dark Current Compensation Using In-Pixel Temperature Sensors. - Accel Abarca; Albert Theuwissen (Sensors, 2023)

A Low-Noise and Small-Area 0.9 V Bandgap Reference in Standard 180 nm CMOS Process for Neural Applications. - José María Loché; Accel Abarca; Thiago Darós; Rodrigo Wrege; Carlos Marques; João Piteira (LASCAS, 2025)

Graphene Transistors' Modeling, Characterization, and a 180 nm CMOS Front-End Design. - Rodrigo Wrege; Mafalda Abrantes; Thiago Darós; Francisco Barreira; Accel Abarca; Carlos Marques; Álvaro Geraldes; José Loché; Jérôme Borme; Luis Jacinto; João Piteira; Pedro Alpuim (LASCAS, 2025)