A D&T Special Report: P1149.4 Mixed-Signal Test Bus. - Adam Cron (IEEE Des. Test Comput., 1996)

IEEE P1149.4-Almost a Standard. - Adam Cron (ITC, 1997)

Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. - Stephen K. Sunter; Adam Osseiran; Adam Cron; Neil G. Jacobson; Dave Bonnett; Bill Eklow; Carl Barnhart; Ben Bennetts (DATE, 2004)

Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test. - Bambang Suparjo; Adam W. Ley; Adam Cron; Heiko Ehrenberg (ITC, 2006)

IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers. - Yu Li 007; Ming Shao; Hailong Jiao; Adam Cron; Sandeep Bhatia; Erik Jan Marinissen (ETS, 2018)

Invited: End-to-End Secure SoC Lifecycle Management. - Md Sami Ul Islam Sami; Fahim Rahman; Farimah Farahmandi; Adam Cron; Mike Borza; Mark Tehranipoor (DAC, 2021)

POCA: First Power-on Chip Authentication in Untrusted Foundry and Assembly. - Md Sami Ul Islam Sami; Fahim Rahman; Adam Cron; Dale R. Donchin; Mike Borza; Farimah Farahmandi; Mark Tehranipoor (HOST, 2021)

IEEE Standard 1838 Is on the Move. - Adam Cron; Erik Jan Marinissen (Computer, 2021)

Quantifiable Assurance: From IPs to Platforms. - Bulbul Ahmed; Md Kawser Bepary; Nitin Pundir; Mike Borza; Oleg Raikhman; Amit Garg; Dale R. Donchin; Adam Cron; Mohamed A. Abdelmoneum; Farimah Farahmandi; Fahim Rahman; Mark Tehranipoor (IACR Cryptol. ePrint Arch., 2021)

Guest Editors' Introduction: Special Issue on Design and Test of Multidie Packages. - Adam Cron; Hailong Jiao; Erik Jan Marinissen (IEEE Des. Test, 2022)

Applying IEEE Test Standards to Multidie Designs. - Teresa McLaurin; Adam Cron (IEEE Des. Test, 2022)

CAPEC: A Cellular Automata Guided FSM-based IP Authentication Scheme. - Mridha Md Mashahedur Rahman; M. Sazadur Rahman; Rasheed Kibria; Mike Borza; Bandy Reddy; Adam Cron; Fahim Rahman; Mark Tehranipoor; Farimah Farahmandi (VTS, 2023)