Extension of the boundary-scan architecture and new idea of BIST for more effective testing and self-testing of interconnections. - Adam Kristof (ED&TC, 1997)

Fast and low-area TPGs based on T-type flip-flops can be easily integrated to the scan path. - Tomasz Garbolino; Andrzej Hlawiczka; Adam Kristof (ETW, 2000)

On-Line Detection of Short Circuits in Digital Devices and Systems. - Adam Kristof (IOLTW, 2002)

Improved Digital I/O Ports Enhance Testability of Interconnections. - Adam Kristof (ITC, 2002)

Digitally programmable modified current differencing transconductance amplifier in 40-nm technology: design flow, parameter analyses and applications. - Andrzej Malcher; Adam Kristof; Andrzej Pulka (IET Circuits Devices Syst., 2020)