Application of the Kull epilayer formulation to a compact model for junction diodes. - Adam W. DiVergilio (BCICTS, 2019)

Physics of Hot Carrier Degradation Under Off-State Mode Operation in High Performance NPN SiGe HBTs. - Dimitris P. Ioannou; Uppili S. Raghunathan; Dave Brochu; Adam W. DiVergilio; Vibhor Jain; John J. Pekarik (BCICTS, 2021)

Performance Improvements of SiGe HBTs in 90nm BiCMOS Process with fT/fmax of 340/410 GHz. - Uppili S. Raghunathan; Saurabh Sirohi; Vaibhav Ruparelia; Prateek Kumar Sharma; Dimitris P. Ioannou; Vibhor Jain; H. K. Kakara; S. Gedela; Venkat Vanukuru; P. Dongmo; C. Luce; R. Hazbun; et al. (BCICTS, 2022)

Practical Simulation and Test Strategies for Advanced Heterojunction Bipolar Transistors. - Adam W. DiVergilio (BCICTS, 2024)

High Temperature Annealing induced recovery of Hot-Carrier degradation in High Performance NPN SiGe HBTs. - Dimitris P. Ioannou; Adam W. DiVergilio (BCICTS, 2024)